2024 FAUG Event Recap: Innovations & Insights
The semiconductor industry has been riding a rollercoaster of emotions lately, from overwhelming demand to a gradually cooling market. Amidst this turbulence, the 2024 Factory Automation User Group (FAUG) event offered insights and innovation.
Semiconductor industry leaders and automation experts gathered to explore solutions and projects that are revolutionizing fab intelligence. From data analytics to production optimizations to tackling complex shopfloor logistics and handling issues, the event offered a unique blend of the latest SYSTEMA developments, real project insights, and an open exchange of ideas among participants.
Highlights from the event:
- Infrastructure / Tibco Alternatives
- Digital Twins, Material Control System (MCS), Material Tracking System (MTS), RI Suite
- Equipment Integration (EI), Recipe Management System (RMS)
The event was packed with informative sessions, lively discussions, and networking opportunities. The evening event was particularly enjoyable, offering a chance to connect and celebrate our collaborative efforts.
Excited about what you read? So are we! The 2025 Factory Automation User Group event promises to be even more engaging and insightful. Don’t miss the chance to stay ahead in the semiconductor industry.
Don’t Miss Out on Next Year’s Event! Complete the form to request an invitation to next year’s event.
We can’t wait to see you there!
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Scaling with One MES to Replace 50+ Legacy Systems
Dr. Thomas Amrein | Vishay Heide
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Maximizing Epitaxy Production Efficiency with AI-Enabled Scheduling: A Comprehensive Evaluation
Dr. Karlheinz Leonardi | Nexperia
Philipp Roßbach | SYSTEMA -
Advanced Material Control System & Optimization
Laurens Borgmann, Agustinus Lawandy | SYSTEMA
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Exchanging the MES Database Online – Hazard or Realistic Task?
Kerstin Kurfürst, Jörg Zschuppe | Infineon
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Handheld Devices – Closing the Gap in Legacy Fabs
Dr. René Kellenbenz | Vishay Heilbronn
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Future Message Bus: And the Winner Is…
Maximilian Rieder | SYSTEMA
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Capacity Calculation Based on Wafer Events and Chamber Tracking
Marian Scheer | Vishay Itzehoe
Gregor Nordheim | SYSTEMA -
Analytics for Single Device Traceability
Leila Ismailova, André Antimonov | SYSTEMA
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SYSTEMA RMS: Latest Developments & Roadmap
Hannes Obermayer | SYSTEMA
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