2024 FAUG Event Recap: Innovations & Insights

The semiconductor industry has been riding a rollercoaster of emotions lately, from overwhelming demand to a gradually cooling market. Amidst this turbulence, the 2024 Factory Automation User Group (FAUG) event offered insights and innovation.

Semiconductor industry leaders and automation experts gathered to explore solutions and projects that are revolutionizing fab intelligence. From data analytics to production optimizations to tackling complex shopfloor logistics and handling issues, the event offered a unique blend of the latest SYSTEMA developments, real project insights, and an open exchange of ideas among participants.

Highlights from the event:

  • Infrastructure / Tibco Alternatives
  • Digital Twins, Material Control System (MCS), Material Tracking System (MTS), RI Suite
  • Equipment Integration (EI), Recipe Management System (RMS)


The event was packed with informative sessions, lively discussions, and networking opportunities. The evening event was particularly enjoyable, offering a chance to connect and celebrate our collaborative efforts.

Excited about what you read? So are we! The 2025 Factory Automation User Group event promises to be even more engaging and insightful. Dont miss the chance to stay ahead in the semiconductor industry.

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We cant wait to see you there!

  • Scaling with One MES to Replace 50+ Legacy Systems

    Dr. Thomas Amrein | Vishay Heide

  • Maximizing Epitaxy Production Efficiency with AI-Enabled Scheduling: A Comprehensive Evaluation

    Dr. Karlheinz Leonardi | Nexperia
    Philipp Roßbach | SYSTEMA

  • Advanced Material Control System & Optimization

    Laurens Borgmann, Agustinus Lawandy | SYSTEMA

  • Exchanging the MES Database Online – Hazard or Realistic Task?

    Kerstin Kurfürst, Jörg Zschuppe | Infineon

  • Handheld Devices – Closing the Gap in Legacy Fabs

    Dr. René Kellenbenz | Vishay Heilbronn

  • Future Message Bus: And the Winner Is…

    Maximilian Rieder | SYSTEMA

  • Capacity Calculation Based on Wafer Events and Chamber Tracking

    Marian Scheer | Vishay Itzehoe
    Gregor Nordheim | SYSTEMA

  • Analytics for Single Device Traceability

    Leila Ismailova, André Antimonov | SYSTEMA

  • SYSTEMA RMS: Latest Developments & Roadmap

    Hannes Obermayer | SYSTEMA